题　目：Aberration-corrected Electron Microscopy Studies of Nanomaterials

报告人：蒋华 博士

　　　　Nanomicroscopy Center, Aalto University, Espoo, Finland

时　间：7月14日（周四）14:00-15:30

地　点：李薰楼468会议室

报告摘要：In this talk I will firstly review the performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University. In addition to its reputable performance at 200kV, the microscope has been demonstrated to show excellent performance at 80 kV. Afterwards, I will review the advances that we have recently made in determining the chiral structure of SWCNTs using electron diffraction technique. We will present results of single-walled carbon nanotube (SWCNT) chirality distribution determination from a round robin sample for the NIST Versailles Project on Advanced Materials and Standards Technical Working Area 34 (VAMAS TWA 34), which is initiated to provide correlation between the absolute distribution of chiralities present in the sample and the electronic properties of the sample. Later on, I will also demonstrate the use of NH3 to achieve the production of large-diameter single-walled carbon nanotubes with a narrow distribution of chiral structure.

Welcome to attend!